X-ray stress analyzers serve throughout the world in laboratories and industrial plants, in transportation, petroleum, steel, aerospace and defense facilities … wherever non-destructive X-ray stress analysis is vital.
For decades, four-circle diffractometers were the workhorse devices used by crystallographers around the world for small molecule and protein structure determination. Many are still in service.
A Microprocessor controlled multichannel X-ray fluorescence spectrometer system that provides truly unmatched performance capability. SIMULTIX incorporates state-of-the-art electronics for high speed data collection and processing resulting in rapid analysis and sample throughput.
High Speed Rsm Of An Epitaxial Film By 1d Detection Mode
A double-crystal spectrometer is developed. This camera is used for measurements of extremely small lattice defects, lattice distortions, inclinations of the lattice planes, and other variants of nearly perfect single crystals like silicon or germanium.
The system is used to determine the concentration of elements by measuring the difference in counts between two matched detectors, each using a different filter—one for absorption and one for transmission.
The microdiffractometer is designed to obtain diffraction patterns from exceedingly small samples as well as extremely small areas optionally selected on a sample. It permits the operator to perform identification analysis and quantitative analysis.
Rigaku High Pressure Workshop
The “D/Max Series B” X-ray diffractometer system incorporates a “Multi-CPU System” to provide diversified, high-speed data processing. The outstanding features of the new D/Max are the result of ’s more than fifty year experience and expertise in the design and manufacture of X-ray diffraction instrumentation.
Rigau’s wafer analyzer is specifically engineered for semiconductor manufacturers, to make simultaneous measurement of the elemental composition and thickness (single or multilayer) of deposited or implanted films.
The use of dual imaging plates as two-dimensional detectors allowed the rapid measurement of diffraction patterns from crystallized proteins. While one plate was collecting data, the other was being read out using a laser system.
Rigaku Corporation Mhps 3s Module 6111146552057
The RIX1000 is a low-cost version of the existing RIX2000 that has similar capabilities, including sophisticated fundamental parameter methods and automatic qualitative analysis.
Multiple layers of different electron density are deposited on a parabolic curved surface providing a spectrally pure, low-loss and low divergence optic. The d-spacing of the multilayer is varied across the surface satisfying Bragg’s Law at all points. This improves spectral purity and spatial distribution for better data quality.
The System 3750, the newest TXRF instrument, covers a broad analysis range from light to heavy elements and offers a high-performance and rapid analysis tool despite its simple and compact design.
Forensics And Conservation
The MiniFlex+ was developed with a totally new philosophy; “Plug 'n Play” XRD. It is small and lightweight; about 1/20th the volume and 1/10th the weight of conventional X-ray diffractometers. foresees that many new applications for XRD will be developed because of the portability and low cost of this high-performance system.
Molecular Structure Corporation was formed in 1973 as the first company in the world to offer crystallographic studies as an analytical service. In the 1980s, MSC became the exclusive North American representatives for single crystal instruments.
For the first time, two graded multilayer optics are bonded together producing a double bounce optic for a nearly monochromatic, high-intensity X-ray beam. Side-by-side geometry results in quicker and easier beam alignment along with increased flux and greatly decreased background.
First Crystallographic Structures Determined Using Rigaku's Recently Launched Electron Diffractometer Published In Nature Communications
Manufactured by a new division of , this CCD detector is introduced to the small molecule crystallography market for use with automated four-circle diffractometers, greatly speeding up data collection.
This 2x2 array of CCD detectors is used primarily by protein crystallographers to speed up data collection when using automated four-circle diffractometers.
The R-AXIS IV++ combines two large active area imaging plates with fast readout speeds and a wide dynamic range, making it ideal for collecting accurate diffraction data from the widest ranges of samples in the home laboratory.
Rigaku Features Latest Instruments At Pittcon 2017
/USA, Inc. Danvers, MA announced that they have completed the acquisition of Osmic, Inc., a leading producer of X-ray optics. Osmic has long been a critical supplier of X-ray optics to and other X-ray instrument manufacturing companies.
Saturn 70 is the most sensitive small molecule CCD detector, providing higher resolution and more redundancy at a given crystal-to-detector distance with the large 70 mm x 70 mm aperture. The most advanced chip technology gives over 96 electrons per incident MoKa photon.
The R-AXIS HTC (high-throughput crystallography) has an innovative three IP (300 mm x 300 mm) design with 10 second deadtime and dual read heads, providing throughput approaching that of CCD detectors with the large active area and superlative dynamic range of an image plate detector. Suitable for the high intensities of a synchrotron or the perfect complement to in-house rotating anode generators.
Rigaku Materials Analysis Enewsletter
/USA and its fully owned subsidiary, Molecular Structure Corporation (MSC), merged to form /MSC, Inc. This action follows a transition year in which /USA’s XRD, XRF, and semiconductor groups were moved from Danvers, MA to MSC’s new facility in The Woodlands, TX USA. The newly formed company, a fully owned subsidiary of the Group, acts as a distributor of ’s XRD, XRF, and semiconductor instrumentation in North America and ’s single crystal instrumentation in most of the world.
Cross Beam Optical™ (CBO) technology uses simultaneously mounted, simultaneously aligned optical components for both focusing (Bragg-Brentano) and parallel beam diffractometer geometries. Users can switch between the two geometries without the need to remove, replace, or realign optical components.
A longer Confocal Max-Flux optic captures more of the X-ray beam resulting in more intensity. A unique adjustable divergence slit allows separation of ref lections from long unit cell samples.
Three Sandstone Porosity Comparison By X Ray Ct
The new Saturn 724+ is the next generation of CCD camera for small molecule crystallography, while the Saturn 924+ is designed for protein crystallography. Incorporating the newest and most sophisticated Kodak® CCD chip, these detectors provide a new dimension in data quality, with a very fast readout speed, a large active area and broad dynamic range.
Corporation announced the formation of Innovative Technologies Europe s.r.o. (RITE) as a European center of excellence for the design, development, and manufacture of X-ray optics, X-ray detectors and X-ray sources, as well as other related scientific products for industry and research. RITE, a wholly owned subsidiary of Corporation (Tokyo, Japan), will be headquartered in fully-equipped, optimized facilities in Prague.
Corporation (Tokyo, Japan) is pleased to announce the formation of a new research and development, manufacturing, sales, service and support subsidiary — Applied Technologies, Inc. (ART) — dedicated to energy dispersive X-ray fluorescence (EDXRF) and related elemental analysis technologies.
Phase Identification Of An Organic Thin Film By Gi Waxs Measurement With A 2d Detector
Newton Scientific, Inc., founded in 1994, is a major supplier of miniature X-ray sources for handheld, portable and benchtop x-ray instruments, and supplies very high voltage power supplies to manufacturers of semiconductor equipment. In 2010, NSI was acquired by Corporation.
Americas Corporation is pleased to announce the acquisition of the handheld Raman technology and product lines from BaySpec, Inc. and the concurrent formation of a new division, Raman Technologies Inc., for R&D, engineering, production, marketing and distribution.
MILabs products are used in more than 65 countries and are supported by a global network of distributors and factory trained support engineers.
Rigaku And Jeol Launch A Revolutionary Electron Diffraction Platform Xtalab Synergy Ed
Announces that that global investment firm The Carlyle Group (NASDAQ: CG) and Mr. Hikaru Shimura, former President and CEO of has agreed to jointly acquire all outstanding shares of .The Ultima IV represents the state-of-the-art in multipurpose X-ray diffraction (XRD) systems. Incorporating 's patented cross beam optics (CBO) technology for permanently mounted, permanently aligned and user-selectable parallel and focusing geometries, the Ultima IV X-ray diffractometer can perform many different measurements...fast.
With a multipurpose diffractometer, performance is measured by not only how fast you perform an experiment but also how fast you can switch between different types of experiments. Individual experiments are optimized with accessories like the D/teX Ultra high-speed position sensitive detector system, but the speed between experiments is radically improved with the combination of the automated alignment and CBO.
The Ultima IV is the only XRD system on the market today that incorporates fully automatic alignment. When coupled with CBO and the in-plane arm, the automatic alignment capability makes the Ultima IV X-ray diffractometer the most flexible system available for multipurpose applications.
Crystal Phase Identification Of Carbide Tips By Micro Area 2d X Ray Diffraction
In the Ultima IV XRD system, CBO technology eliminates time spent switching geometries, enables everyday users to run both sets of experiments without the need to reconfigure the system, and reduces wear and possible optic damage associated with the recurrent switching process. CBO and automatic alignment combine for the ultimate in functionality for: micro-crystalline diffraction, thin-film diffraction, small angle scattering, and in-plane scattering.
Reactor X allows measurements to be performed under high temperature (RT - 1000°C) in vacuum, inert gas, reactive gas, or mixture of these. Infrared heating enables rapid heating and cooling of the sample and use of wide variety of sample holders so that a suitable sample holder material can be selected according to the combination of the sample, gas, and applied temperature.
Multipurpose attachment for the precise alignment of thin film samples. Fully automated alignment provides extreme ease in the positioning of samples for X-ray reflectivity, in-plane diffraction, and orientation analysis. Utilizes the Rx/Ry design for the most flexible reciprocal space scanning options.
Rigaku's Virtual Analytical X Ray Convention
The TTK 600 Low-Temperature Chamber is a non-ambient attachment for powder X-ray diffraction studies from -190°C to 600°C. Different sample holders allow investigating samples in reflection and transmission geometry. Samples can be measured in vacuum,
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